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2 article(s) from Rosenwaks, Yossi

Kelvin probe force microscopy of nanocrystalline TiO₂ photoelectrodes

Alex Henning,
Gino Günzburger,
Res Jöhr,
Yossi Rosenwaks,
Biljana Bozic-Weber,
Catherine E. Housecroft,
Edwin C. Constable,
Ernst Meyer and
Thilo Glatzel

Beilstein J. Nanotechnol. 2013, 4, 418–428, doi:10.3762/bjnano.4.49

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Figure 1: Different components of a DSC under illumination in an open circuit. Upon light excitation electron...

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Figure 2: Schematic band diagram for a KPFM tip in close proximity to an n-type semiconductor surface (a) in ...

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Figure 3: Schematic structures of (a) the standard dye N719 and (b) a copper(I)-based dye, assembled in situ ...

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Figure 4: Topography and work function of (a) a bare TiO₂ and (b) an N719 sensitized TiO₂ layer with a thickn...

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Figure 5: SPV for bare nc-TiO₂ in dependency on (a) the wavelength and (b) on the light intensity under super...

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Figure 6: Semilogarithmic plot of the SPV dependence on the incident light intensity, (a) measured for three ...

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Figure 7: Time evolution of the measured CPD of TiO₂ and TiO₂ + N719 during the turning on and off of the vio...

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Figure 8: Schematic illustration of the KPFM measurement system and the surface dipole induced by adsorption ...

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Figure 9: (a) I–V curves for a bare TiO₂ solar cell and DSCs sensitized with Cu(I) dye and N719. (b) A schema...

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Figure 10: Lift-mode KPFM setup inside a nitrogen glove box in combination with a tunable illumination system ...

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Full Research Paper

Published 01 Jul 2013

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The role of the cantilever in Kelvin probe force microscopy measurements

George Elias,
Thilo Glatzel,
Ernst Meyer,
Alex Schwarzman,
Amir Boag and
Yossi Rosenwaks

Beilstein J. Nanotechnol. 2011, 2, 252–260, doi:10.3762/bjnano.2.29

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Figure 1: (a) Geometrical model of a tip, with cone length l, half-aperture angle θ₀, spherical apex radius R...

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Figure 2: One dimensional PSF calculated for two different probe–sample distances with and without the cantil...

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Figure 3: Left axis: Relative magnitude of the homogeneous force distribution on different fractions of the p...

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Figure 4: Line section (vertical line at inset figure) for KPFM simulation with different cantilever geometri...

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Figure 5: Line section of UHV KPFM (i) measurements [20], (ii) simulated, and (iii) theoretical potential distrib...

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Figure 6: Beam deflection influence on PSF. The dashed line represents the PSF of a deflected beam while the ...

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Figure 7: Second harmonic deflection relative to the cantilever at its rest position. The free edge deflectio...

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Figure 8: Second harmonic weighting influence on the PSF. Dashed lines: PSF calculated with the second harmon...

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Full Research Paper

Published 18 May 2011

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Kelvin probe force microscopy of nanocrystalline TiO2 photoelectrodes

The role of the cantilever in Kelvin probe force microscopy measurements

Kelvin probe force microscopy of nanocrystalline TiO₂ photoelectrodes